Technical Information

In this page a collection of technical information about the tomography are reported, for example the Beryllium filters used on a particular probe, or the distance pinhole-diode and so on. Also, links to useful pictures, drawings, formulae etc. are present.

Beryllium foils and pinhole-diode distance

SXR1 probe

Installed on 9-nov-2001. Data available from shot #1011115016. The detector has been always the IRD AXUV-20ELM, except where indicated.

9-Nov-2001 to 27-Nov-2001: Be=16 microns flat, d_Si_pin=10.15 mm, pinhole 1x4 mm
28-Nov-2001 to 25-Feb-2002: Be=30 microns flat, d_Si_pin=10.15 mm
26-Feb-2002 to 29-Jun-2002: Be=16 microns flat, d_Si_pin=10.15 mm. From shot #1020304106 to #1020305115 the SXR1 probe had been used as a bolometer (without filter)
30-jun-2002 to shot #1030415038: Be=16 microns, curved, d_Si_pin=9.85 mm. The probe has been replaced with a new one.
shot #1030415096 to 18-apr-2003: Be=16 microns, curved (the same as the previous period) but rotated 180° (to check the coating on the filter), d_Si_pin=10.45 mm, pinhole 0.8x4 mm
19-Apr-2003 to 25-Apr-2003: Be=18 microns, curved, d_Si_pin=9.95 mm
26-Apr-2003 to 28-Apr-2003: Be=18 microns, curved, d_Si_pin=9.95 mm, blind pinhole (two 0.1 mm thick stainless steel foils)
29-Apr-2003 to 2-May-2003: Be=18 microns, curved, d_Si_pin=19.85 mm (with 10 mm ring), pinhole 0.8x4 mm
3-May-2003 to 6-May-2003: Be=18 microns, curved, d_Si_pin=19.65 mm (with 10 mm ring), pinhole 0.8x4 mm (Mikhail's internal preamps in SXR1)
7-May-2003 to 4-Apr-2004: Be=18 microns, curved, d_Si_pin=19.85 mm (with 10 mm ring), pinhole 0.8x4 mm
5-Apr-2004 to 13-Aug-2004: Be=13 microns, curved, d_Si_pin=9.95 mm, pinhole 1x4 mm
14-Aug-2004 to 16-Aug-2004: Be=13 microns, flat, d_Si_pin=11.09 mm, pinhole 1x4 mm (with UDT)
17-Aug-2004 to 20-Aug-2004: Be=13 microns, flat, d_Si_pin=10.38 mm, pinhole 1x4 mm (with UDT)
21-Aug-2004 to 22-Aug-2004: Be=13 microns, flat, d_Si_pin=9.40 mm, pinhole 1x4 mm (with IRD-ELAD)
23-Aug-2004 to 26-Jul-2005: Be=14 microns, flat, d_Si_pin=9.65 mm, pinhole 1x4 mm, offset pinhole=5 mm (towards diode 1)
27-Jul-2005 to 6-Sep-2005: Be=15 microns, curved, d_Si_pin=9.65 mm, pinhole 1x4 mm
7-Sep-2005 to 14-Sep-2005: Be=80 microns (23+28+29), curved, d_Si_pin=9.65 mm, pinhole 1x4 mm
15-Sep-2005: Be=140 microns (70+70), curved, d_Si_pin=9.35 mm, pinhole 1x4 mm, new IRD array installed
16-Sep-2005 to 21-Mar-2006: Be=15 microns, curved, d_Si_pin=9.50 mm, pinhole 1x4 mm, IRD array is the same used from 23-Aug-2004 up to 14-Sep-2005
22-Mar-2006 to 11-Oct-2006: Be=303 microns (85+79+80+59), curved, d_Si_pin=9.50 mm, pinhole 1x4 mm
12-Oct-2006 to 18-Oct-2006: Be=15 microns, curved, d_Si_pin=9.50 mm, pinhole 1x4 mm. This Be foil is the same previously used from 16-Sep-2005 to 21-Mar-2006
19-Oct-2006 to 18-Nov-2007: Be=303 microns (85+79+80+59), curved, d_Si_pin=10.075 mm, pinhole 1x4 mm. New inner cables installed
19-nov-2007 to 21-May-2008: Be=408 microns (19+3x57+59+79+80), curved, d_Si_pin=14.975 mm (with 5 mm ring), pinhole 1x4 mm
22-May-2008 to today: Be=408 microns (19+57+57+59+79+57+80), curved, d_Si_pin=15.025 mm (with 5 mm ring), pinhole 1x4 mm. IRD diode array replaced with the new AXUV-20ELM-G

TO BE UPDATED

SXR2 probe

Installed on 20-may-2002. Data available from 5-jun-2002.

20-May-2002 to Sep-2003: Be=16 microns, curved, d_Si_pin=9.80 mm, pinhole 1x4 mm
sometimes in Sep-2003 to 26-jul-2005: Be=14 microns, curved, d_Si_pin=9.85 mm, pinhole 1x4 mm
27-Jul-2005 to 16-Nov-2005: Be=15 microns, curved, d_Si_pin=9.85 mm, pinhole 1x4 mm
17-Nov-2005 to 2-Nov-2007: Be=303 microns (69+70+81+83), curved, d_Si_pin=9.85 mm, pinhole 1x4 mm
3-Nov-2006 to shot 1071107018: Be=303 microns (18+23+28+70+81+83), curved, d_Si_pin=9.475 mm, pinhole 1x4 mm
from shot 1071107019 to 20-Nov-2007: Be=18 microns, curved, d_Si_pin=9.475 mm, pinhole 1x4 mm
21-Nov-2007 to 21 May 2008: Be=408 microns (19+18+29+30+57+70+102+83), curved, d_Si_pin=14.575 mm (with 5 mm ring), pinhole 1x4 mm
22-May-2008 to today: Be=408 microns (18+3x26+57+70+102+83), curved, d_Si_pin=14.975 mm (with 5 mm ring), pinhole 1x4 mm. IRD diode array replaced with the new AXUV-20ELM-G

TO BE UPDATED

SXR3 probe

Installed on 13-apr-2004. Data available from shot #1040413061.

13-Apr-2004: Be=19 microns, curved, d_Si_pin=14.45 mm (with 5 mm ring), pinhole 1x4 mm
14-Apr-2004 to 6-Sep-2005: Be=13 microns, curved, d_Si_pin=14.45 mm (with 5 mm ring), pinhole 1x4 mm
7-Sep-2005 to 14-Sep-2005: Be=140 microns (70+70), curved, d_Si_pin=14.45 mm (with 5 mm ring), pinhole 1x4 mm
15-Sep-2005: Be=254 microns (23+58+59+59+60), curved, d_Si_pin=14.45 mm (with 5 mm ring), pinhole 1x4 mm
16-Sep-2005 to 21-Mar-2006: Be=15 microns, curved, d_Si_pin=14.45 mm (with 5 mm ring), pinhole 1x4 mm
22-Mar-2006 to 11-Oct-2006: Be=761 microns (9x78+59), curved, d_Si_pin=14.45 mm (with 5 mm ring), pinhole 1x4 mm
12-Oct-2006 to 18-Oct-2006: Be=15 microns, curved, d_Si_pin=14.45 mm (with 5 mm ring), pinhole 1x4 mm. This Be foil is the same previously used from 16-Sep-2005 to 21-Mar-2006
19-Oct-2006 to 16-May-2007: Be=761 microns (9x78+59), curved, d_Si_pin=14.150 mm (with 5 mm ring), pinhole 1x4 mm. Replaced the IRD diode array with a new one
17-May-2007 to 19-Nov-2007: Be=761 microns (9x78+59), curved, d_Si_pin=9.650 mm (no 5 mm ring), pinhole 1x4 mm
20-Nov-2007 to 21-May-2008: Be=821 microns (26+2x56+59+8x78), curved, d_Si_pin=14.775 mm (with 5 mm ring), pinhole 1x4 mm
22-May-2007 to today: Be=821 microns (26+2x56+59+8x78), curved, d_Si_pin=14.725 mm (with 5 mm ring), pinhole 1x4 mm. IRD diode array replaced with the new AXUV-20ELM-G

TO BE UPDATED

SXR4 probe

Installed on 6-apr-2004. Data available from shot #1040413061.

6-Apr-2004 to 13-Apr-2004: Be=19 microns, curved, d_Si_pin=14.90 mm (with 5 mm ring), blind pinhole
14-Apr-2004 to 6-Sep-2005: Be=13 microns, curved, d_Si_pin=14.85 mm (with 5 mm ring), pinhole 1x4 mm
7-Sep-2005 to 14-Sep-2005: Be=478 microns (69+79+81+81+83+85), curved, d_Si_pin=14.85 mm (with 5 mm ring), pinhole 1x4 mm
15-Sep-2005: Be=478 microns, curved, d_Si_pin=14.825 mm (with 5 mm ring), pinhole 1x4 mm, new IRD array installed
16-Sep-2005 to 21-Mar-2006: Be=15 microns, curved, d_Si_pin=14.825 mm (with 5 mm ring), pinhole 1x4 mm
22-Mar-2006 to 11-Oct-2006: Be=761 microns (81+3x79+3x78+70+59+80), curved, d_Si_pin=14.825 mm (with 5 mm ring), pinhole 1x4 mm
12-Oct-2006 to 18-Oct-2006: Be=15 microns, curved, d_Si_pin=14.825 mm (with 5 mm ring), pinhole 1x4 mm. This Be foil is the same previously used from 16-sep-2005 to 21-mar-2006
19-Oct-2006 to 16-May-2007: Be=761 microns (81+3x79+3x78+70+59+80), curved, d_Si_pin=14.750 mm (with 5 mm ring), pinhole 1x4 mm
17-May-2007 to 19-Nov-2007: Be=761 microns (81+3x79+3x78+70+59+80), curved, d_Si_pin=9.775 mm (no 5 mm ring), pinhole 1x4 mm
20-Nov-2007 to 21-May-2008: Be=821 microns (26+57+58+59+70+3x78+3x79+80), curved, d_Si_pin=14.925 mm (with 5 mm ring), pinhole 1x4 mm
21-May-2008 to today: Be=821 microns (26+57+58+59+70+3x78+3x79+80), curved, d_Si_pin=14.875 mm (with 5 mm ring), pinhole 1x4 mm. IRD diode array replaced with the new AXUV-20ELM-G

TO BE UPDATED

Geometry schematics

Coordinate definition.

Definitions of the pinhole and detector positions. The distance detector-pinhole, d_Si_pin, is the distance of the detector from the edge of the probe - 0.50 mm.